Dynamic Ultra Micro Hardness [ISO/TS 19278]

Learn More


A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers.

This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods.
Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.